Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/07/1995
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Application #:
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07850916
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Filing Dt:
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03/13/1992
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Inventors:
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IZUMI FUSEGAWA, HIROTOSHI YAMAGISHI, NOBUYOSHI FUJIMAKI, YUKIO KARASAWA
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Title:
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METHOD FOR TESTING QUALITY OF SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| A CORPORATION OF JAPAN |
| 4-2, MARUNOUCHI 1 CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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| TOWNSEND, SNIDER & BANTA |
| TERESA J. BANTA |
| 1225 EYE ST., N.W. STE. 500 |
| WASHINGTON, DC 20007 |
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