Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/07/1995
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Application #:
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08079639
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Filing Dt:
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06/18/1993
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Inventors:
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FUTOSHI ISHIDA, KIYOFUMI HASHIMOTO, TOSHIHIDE DOHI, TAKAO KOBAYASHI, YUTAKA TOKUYAMA
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Title:
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AN INTERFEROMETER FOR MEASURING A SURFACE CONFIGURATION OF A TEST OBJECT BY AN INTERFERENCE PATTERN USING GRATINGS TO GENERATE WAVE FRONTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| OSAKA KOKUSAI BUILDING, 3-13, 2-CHOME, AZUCHI-MACHI |
| CHUO-KU, OSAKA-SHI |
| OSAKA, JAPAN |
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| JOSEPH W. PRICE |
| PRICE, GESS & UBELL |
| 2100 S.E. MAIN ST., STE. 250 |
| IRVINE, CA 92714 |
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