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Patent Assignment Abstract of Title

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Total Assignments: 1

Patent #:	5392113	Issue Dt:	02/21/1995	Application #:	07954200	Filing Dt:	09/30/1992
Inventors:	ANTHONY SAYKA, STACY W. HALL, JUDY U. GALLOWAY, PIERRE LEROUX, BRYAN D. SCHMIDT et al
Title:	SEMICONDUCTOR WAFER DEFECT MONITORING

Assignment: 1

Reel/Frame:

006381/0864

Recorded: 09/30/1992

Pages: 3

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST.

Assignors:

SAYKA, ANTHONY

Exec Dt:

09/02/1992

HALL, STACY W.

Exec Dt:

09/04/1992

GALLOWAY, JUDY U.

Exec Dt:

09/09/1992

LEROUX, PIERRE

Exec Dt:

09/09/1992

SCHMIDT, BRYAN D.

Exec Dt:

09/09/1992

SIEMS, DANIEL D.

Exec Dt:

09/08/1992

TAYLOR, HENRY B. III

Exec Dt:

09/08/1992

VOKOUN, EDWARD R.

Exec Dt:

09/09/1992

Assignee:

VLSI TECHNOLOGY, INC.

1109 MCKAY DRIVE, MS/45

SAN JOSE, CALIFORNIA 95131

Correspondent:

WILLIAM G. BECKER

VLSI TECHNOLOGY, INC.

1109 MCKAY DRIVE, MS-45

SAN JOSE, CA 95131

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