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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/04/1995
Application #:
07955979
Filing Dt:
10/02/1992
Inventors:
SEIJI TAKEUCHI, TETSUHARU NISHIMURA, MINORU YOSHII, HIROYASU NOSE, KOH ISHIZUKA
Title:
MEASURING METHOD AND MEASURING APPARATUS FOR DETERMINING THE RELATIVE DISPLACEMENT OF A DIFFRACTION GRATING WITH RESPECT TO A PLURALITY OF BEAMS
Assignment: 1
Reel/Frame:
006371/0017Recorded: 12/02/1992Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
11/19/1992
Exec Dt:
11/19/1992
Exec Dt:
11/19/1992
Exec Dt:
11/19/1992
Exec Dt:
11/19/1992
Assignee:
30-2, 3-CHOME, SHIMOMARUKO, OHTA-KU
TOKYO, JAPAN
Correspondent:
FITZPATRICK, CELLA, HARPER & SCINTO
GARY M. JACOBS
277 PARK AVE.
NEW YORK, NY 10172-0194

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