Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/11/1995
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Application #:
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08088482
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Filing Dt:
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07/07/1993
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Inventor:
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SURESH C. SHARMA
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Title:
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APPARATUS AND METHOD FOR RAPID AND NONDESTRUCTIVE DETERMINATION OF LATTICE DEFECTS IN SEMICONDUCTOR MATERIALS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 201 WEST SEVENTH STREET, AUSTIN, TX 78701 |
| TEXAS |
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| AMBER L. HATFIELD |
| ARNOLD, WHITE & DURKEE |
| P.O. BOX 4433 |
| HOUSTON, TX 77210 |
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