Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/09/1995
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Application #:
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08113910
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Filing Dt:
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08/31/1993
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Inventors:
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SHINICHIRO SAISHO, TOSHINOBU IKEDA, AKIRA ODAGIRI
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Title:
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METHOD OF MEASURING REFRACTIVE INDEX OF THIN FILM AND REFRACTIVE INDEX MEASURING APPARATUS THEREFOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-6,MINAMI OHI 3-CHOME |
| SHINAGAWA-KU, TOKYO, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER & |
| NEUSTADT, P.C. |
| ROBERT F. GNUSE |
| 1755 JEFFERSON DAVIS HIGHWAY, 4TH FL. |
| ARLINGTON, VA 22202 |
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