Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/06/1995
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Application #:
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08116232
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Filing Dt:
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08/31/1993
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Inventors:
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PATRICK D. KINNEY, YURI S. URITSKY, HARRY O. LEE
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Title:
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MULTIPLE-SCAN METHOD FOR WAFER PARTICLE ANALYSIS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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3050 BOWERS AVE. |
SANTA CLARA, CALIFORNIA 95054 |
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CHARLES S. GUENZER |
PATENT COUNSEL - MAIL STOP #0934 |
APPLIED MATERIALS, INC. |
3050 BOWERS AVENUE |
SANTA CLARA, CA 95054 |
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