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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/19/1995
Application #:
08331836
Filing Dt:
10/31/1994
Inventors:
PETER K. LOEWENHARDT, HIROJI HANAWA, GERALD Z. YIN
Title:
COMPOSITE DIAGNOSTIC WAFER FOR SEMICONDUCTOR WAFER PROCESSING SYSTEMS
Assignment: 1
Reel/Frame:
007421/0815Recorded: 04/10/1995Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/28/1994
Exec Dt:
10/28/1994
Exec Dt:
10/28/1994
Assignee:
LEGAL AFFAIRS DEPARTMENT
3050 BOWERS AVENUE, M/S #2634
SANTA CLARA, CALIFORNIA 95054
Correspondent:
APPLIED MATERIALS, INC.
PETER J. SGARBOSSA
LEGAL AFFAIRS DEPARTMENT
3050 BOWERS AVENUE, M/S #0934
SANTA CLARA, CALIFORNIA 95054

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