Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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09/19/1995
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Application #:
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08077062
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Filing Dt:
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06/16/1993
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Inventors:
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YOICHIRO OGITA, TATEO KUSAMA
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Title:
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METHOD OF EVALUATING LIFETIME OF SEMICONDUCTOR MATERIAL AND APPARATUS FOR THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1030, SHIMO-OGINO ATSUGI-SHI, KANAGAWA JAPA |
| JAPAN |
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| MICHAEL K. MUTTER |
| BIRCH, STEWART, KOLASCH & BIRCH |
| P.O. BOX 747 |
| FALLS CHURCH, VA 22040-0747 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, OCHIAI TAMA-SHI |
| TOKYO, JAPAN |
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| 28, AZA-JONO, KITAIMA |
| BISAI-SHI, AICHI-KEN, JAPAN |
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| MICHAEL K. MUTTER |
| BIRCH, STEWART, KOLASCH & BIRCH |
| P.O. BOX 747 |
| FALLS CHURCH, VA 22040-0747 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1030 SHIMO-OGINO |
| ATSUGI-SHI, KANAGAWA, JAPAN |
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| WENDEROTH LIND & PONACK, LLP |
| NILS E. PEDERSEN, ESQ. |
| 2033 K STREET, NW |
| SUITE 800 |
| WASHINGTON, DC 20006-1021 |
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