Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/26/1995
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Application #:
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08091261
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Filing Dt:
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07/15/1993
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Inventors:
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KIYOFUMI KAWAMOTO, MASAHIKO YOSHIMOTO
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Title:
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SEMICONDUCTOR TEST SYSTEM, SEMICONDUCTOR TEST METHOD, METHOD OF WIRING PATTERN FORMATION AND SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO 100, JAPAN |
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| MARVIN J. SPIVAK |
| OBLON, SPIVAK, MCCLELLAND, MAIER |
| & NEUSTADT, P.C. |
| 1755 JEFFERSON DAVIS HIGHWAY, 4TH FLOOR |
| ARLINGTON, VA 22202 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-2, OOTEMACHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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| MARVIN J. SPIVAK |
| OBLON, SPIVAK, MCCLELLAND, MAIER |
| & NEUSTADT, P.C. |
| 1755 JEFFERSON DAVIS HIGHWAY, 4TH FLOOR |
| ARLINGTON, VA 22202 |
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