Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/21/1995
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Application #:
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08168150
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Filing Dt:
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12/17/1993
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Inventors:
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TAKAYUKI HASEGAWA, HIDEHIKO FUJIOKA
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Title:
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METHOD OF MEASURING GAS PURITY INFORMATION, CHAMBER UNIT AND EXPOSURE UNIT USING THE METHOD AND A DEVICE PRODUCTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 30-2, 3-CHOME, SHIMOMARUKO, OHTA-KU, TOKYO, JAPAN |
| JAPAN |
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| STEVEN E. EARNER |
| FITZPATRICK, CELLA, HARPER & SCINTO |
| 277 PARK AVENUE |
| NEW YORK, NY 10172-0194 |
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