Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/20/1996
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Application #:
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08264718
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Filing Dt:
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06/23/1994
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Inventors:
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TATSUYA ISHII, KAZUTOSHI MIYAMOTO
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Title:
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TEST ANALYSIS APPARATUS AND ANALYSIS METHOD FOR SEMICONDUCTOR WAFER USING OBIC ANALYSIS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO 100, JAPAN |
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| JEFFREY A. WYAND |
| LEYDIG, VOIT & MAYER |
| SUITE 300 |
| 700 THIRTEENTH STREET, N.W. |
| WASHINGTON, D.C. 20005 |
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