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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/26/1996
Application #:
08010180
Filing Dt:
01/28/1993
Inventor:
TSUNEO NAKATA
Title:
METHOD OF TESTING FOR STUCK-AT FAULT IN A SYNCHRONOUS CIRCUIT
Assignment: 1
Reel/Frame:
006422/0648Recorded: 01/28/1993Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
01/18/1993
Assignee:
1015, KAMIKODANAKA, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA, 211, JAPAN
Correspondent:
STAAS & HALSEY
JAMES D. HALSEY, JR.
1825 K STREET, N.W., SUITE 816
WASHINGTON, D.C. 20006

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