Patent Assignment Abstract of Title
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For pending or abandoned applications please consult USPTO staff.
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/02/1996
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Application #:
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08460053
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Filing Dt:
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06/02/1995
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Inventors:
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SADAO HIRAE, HIROSHI OKADA, HIDEAKI MATSUBARA
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Title:
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APPARATUS AND METHOD FOR ELECTRICAL MEASUREMENT OF SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-CHOME, HORIKAWA-DORI, KAMIKYO-KU |
| 1-1, TENJINKITAMACHI, TERANOUCHI-AGARU |
| KYOTO, JAPAN |
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| OSTROLENK, FABER, GERB & SOFFEN |
| JAMES A. FINDER |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036-8403 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| TENJINKITA-MACHI 1-1, TERANOUCHI-AGARU 4-CHOME |
| HORIKAWA-DORI, KAMIGYO-KU |
| KYOTO, JAPAN 602-8585 |
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| OSTROLENK FABER LLP |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036 |
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