Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/09/1996
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Application #:
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08210122
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Filing Dt:
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03/17/1994
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Inventors:
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SRIMAT T. CHAKRADHAR, IGOR RIVIN
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Title:
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TESTING VLSI CIRCUITS FOR DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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4 INDEPENDENCE WAY |
PRINCETON, NEW JERSEY 08540 |
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PHILIP J. FEIG |
NEC RESEARCH INSTITUTE, INC. |
4 INDEPENDENCE WAY |
PRINCETON, NJ 08540 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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7-1 SHIBA 5-CHOME, MINATO-KU |
TOKYO, JAPAN |
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NEC RESEARCH INSTITUTE, INC. |
PHILIP J. FEIG |
4 INDEPENDENCE WAY |
PRINCETON, NJ 08540 |
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