Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/14/1996
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Application #:
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08344891
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Filing Dt:
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11/25/1994
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Inventor:
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JOON HWANG
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Title:
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PHOTO MASK PROVIDED WITH DEVELOPMENT RATE MEASURING PATTERN AND METHOD FOR MEASURING DEVELOPMENT RATE UNIFORMITY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMRI, BUBALEUB ICHONKUN |
| KYOUNGKIDO 467-860,, KOREA, REPUBLIC OF |
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| MERCHANT, GOULD, SMITH, EDELL, ET AL. |
| CURTIS B. HAMRE |
| 3100 NORWEST CENTER |
| 90 SOUTH SEVENTH STREET |
| MINNEAPOLIS, MN 55402-4131 |
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