Patent Assignment Abstract of Title
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For pending or abandoned applications please consult USPTO staff.
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Total Assignments:
2
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Patent #:
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Issue Dt:
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05/28/1996
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Application #:
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08151367
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Filing Dt:
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11/12/1993
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Inventors:
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YUICHI ABE, MASAO YAMAGUCHI, MUNETOSI NAGASAKA
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Title:
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PROBE APPARATUS FOR TESTING MULTIPLE INTEGRATED CIRCUIT DIES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3-1, NISHI-SHINJUKU |
| SHINJUKU-KU, TOKYO, JAPAN |
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| 2381-1 KITAGEJO, FUJII-MACHI |
| NIRASAKI-SHI, YAMANASHI, JAPAN 407 |
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| OBLON SPIVAK MCCLELLAND ET AL. |
| MARVIN J. SPIVAK |
| FOURTH FLOOR |
| 1755 JEFFERSON DAVIS HIGHWAY |
| ARLINGTON, VA 22202 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-6 AKASAKA 5-CHOME |
| MINATO-KU, TOKYO 107, JAPAN |
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| OBLON SPIVAK MCCLELLAND MAIER & NEUSTADT |
| MARVIN J. SPIVAK |
| 1755 JEFFERSON DAVIS HIGHWAY |
| FOURTH FLOOR |
| ARLINGTON, VA 22202 |
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