Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/18/1996
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Application #:
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08361224
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Filing Dt:
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12/21/1994
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Inventors:
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HAJIME SATO, YOSHIKAZU SAKAUE
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Title:
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MEASUREMENT APPARATUS FOR MEASURING DIMENSIONS OF SEMICONDUCTOR DEVICE AND METHOD OF MEASURING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, |
| TOKYO 100, JAPAN |
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| LEYDIG, VOIT & MAYER |
| JEFFREY A. WYAND |
| SUITE 300 |
| 700 13TH ST., NW |
| WASHINGTON, DC 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, |
| KANAGAWA, JAPAN 211-8668 |
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| MCDERMOTT WILL & EMERY LLP |
| 600 THIRTEENTH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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