Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/02/1996
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Application #:
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08274716
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Filing Dt:
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07/18/1994
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Inventors:
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EIJI INUZUKA, SHIGEHISA OGURI, KOUJI SUZUKI, WATARU NAGATA, YASUSHI HIRUMA
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Title:
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SEMICONDUCTOR DEVICE INSPECTION SYSTEM INVOLVING SUPERIMPOSITIION OF IMAGE DATA FOR DETECTING FLAWS IN THE SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1126-1 ICHINO-CHO |
| HAMAMATSU-SHI, SHIZUOKA-KEN, JAPAN |
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| GLENN J. PERRY |
| CUSHMAN, DARBY & CUSHMAN |
| 1100 NEW YORK AVENUE, N.W. |
| 9TH FLOOR |
| WASHINGTON, DC 20005-3918 |
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