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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/02/1996
Application #:
08158843
Filing Dt:
11/24/1993
Inventors:
NAOFUMI KONDO, MIKIO KATAYAMA, MASAYA OKAMOTO, MAKOTO MIYAGO, KIYOSHI NAKAZAWA et al
Title:
INSPECTING METHOD, INSPECTING APPARATUS, AND DEFECT CORRECTING METHOD
Assignment: 1
Reel/Frame:
006870/0746Recorded: 01/24/1994Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Exec Dt:
01/07/1994
Assignee:
22-22, NAIGAIKE-CHO, ABENO-KU
OSAKA 545, JAPAN
Correspondent:
DAVID G. CONLIN, ESQ.
DIKE, BRONSTEIN, ROBERTS & CUSHMAN
130 WATER STREET
BOSTON, MA 02109

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