Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/10/1996
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Application #:
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08171026
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Filing Dt:
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12/21/1993
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Inventors:
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SADAO HIRAE, HIDEAKI MATSUBARA, MOTOHIRO KOUNO, TAKAMASA SAKAI
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Title:
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NON-DESTRUCTIVE MEASURING SENSOR FOR SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, TENJINKITAMACHI, TERANOUCHI-AGARU, 4-CHOME, HORIKAWA-DORI |
| KAMIKYO-KU, KYOTO, JAPAN |
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| OSTROLENK, FABER, GERB & SOFFEN |
| STEVEN I. WEISBURD |
| 1180 AVE. OF THE AMERICAS |
| NEW YORK, NY 10036-8403 |
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