Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/24/1996
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Application #:
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08399220
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Filing Dt:
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03/06/1995
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Inventors:
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YASUHIKO YOKOYA, NOBORU YAMAZAKI, MITSUO NAKAMURA, SYUUICHI HASUDA, EISAKU NAMAI et al
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Title:
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JIG FOR MEASURING THE CHARACTERISTICS OF A SEMICONDUCTOR, MANUFACTURING METHOD FOR THE SAME, AND USAGE OF THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, 2-CHOME, NISHISHINJUKU SHINJUKU-KU |
| TOKYO, JAPAN |
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| 2-12-20, NAGARA-NISHI, KITA-KU |
| OSAKA, JAPAN 531 |
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| DAVID T. TERRY |
| 1300 NORTH SEVENTEENTH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209 |
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