Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
2
|
|
Patent #:
|
|
Issue Dt:
|
10/22/1996
|
Application #:
|
08363535
|
Filing Dt:
|
12/23/1994
|
|
Inventors:
|
TATSUFUMI KUSUDA, MOTOHIRO KOUNO, IKUYOSHI NAKATANI, SADAO HIRAE
|
|
Title:
|
METHOD AND APPARATUS FOR MEASURING INSULATION FILM THICKNESS OF SEMICONDUCTOR WAFER
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-1, TENJINKITAMACHI, TERANOUCHI-AGARU 4-CHOME HORIKAWA-DORI, KAMIKYO-KU, KYOTO, JAPAN CORPORATION OF JAPAN |
| KYOTO,, JAPAN |
|
|
|
|
| OSTROLENK, FABER, GERB & SOFFEN |
| JEROME M. BERLINER |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036-8403 |
|
|
|
Assignment:
2
|
|
|
|
|
|
|
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| TENJINKITA-MACHI 1-1, TERANOUCHI-AGARU 4-CHOME |
| HORIKAWA-DORI, KAMIGYO-KU |
| KYOTO, JAPAN 602-8585 |
|
|
|
|
| OSTROLENK FABER LLP |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036 |
|
|
Search Results as of:
05/03/2024 05:47 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
