Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/17/1996
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Application #:
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08361384
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Filing Dt:
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12/22/1994
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Inventor:
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JUNICHIRO SHIBATA
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Title:
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SEMICONDUCTOR WAFER PROBING METHOD INCLUDING ARRANGING INDEX REGIONS THAT INCLUDE ALL CHIPS AND MINIMIZE THE OCCURRENCE OF NON-CONTACT BETWEEN A CHIP AND A PROBE NEEDLE DURING CHIP VERIFICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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3-6, AKASAKA 5-CHOME |
MINATO-KU, TOKYO-TO, JAPAN |
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BEVERIDGE, DEGRANDI, WEILACHER & YOUNG |
MICHAEL A. MAKUCH |
THE MANULIFE BUILDING |
1850 M STREET, N.W., SUITE 800 |
WASHINGTON, D.C. 20036 |
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