Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/25/1997
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Application #:
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08624954
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Filing Dt:
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03/27/1996
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Inventors:
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SHINICHI OKI, KOICHI NAGAO, YOSHIRO NAKATA
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Title:
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INSPECTING METHOD FOR SEMICONDUCTOR DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1006 OAZA KADOMA, KADOMA-SHI |
| OSAKA 571, JAPAN |
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| WILLAN BRINKS HOFER GILSON & LIONE |
| KENNETH L. CAGE |
| 2000 K STREET, N.W. |
| SUITE 200 |
| WASHINGTON, D.C. 20006 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| C/O SAKURA SOGO JIMUSHO |
| 1-11 KANDA-JINBOCHO, CHIYODA-KU |
| TOKYO, JAPAN |
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| SUGHRUE MION, PLLC |
| 2100 PENNSYLVANIA AVE. NW |
| SUITE 800 |
| WASHINGTON, DC 20037-3213 |
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