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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/11/1997
Application #:
08410818
Filing Dt:
03/27/1995
Inventor:
KOJI TAKAHASHI
Title:
FAILURE ANALYZER FOR SEMICONDUCTOR TESTER
Assignment: 1
Reel/Frame:
007500/0650Recorded: 05/30/1995Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/16/1995
Assignee:
SHINJUKU-KU
NS BLDG., 4-1, NISHI-SHINJUKU 2-CHOME
TOKYO, JAPAN
Correspondent:
WILLIAM B. BUNKER
KNOBBE, MARTENS, OLSON & BEAR
16TH FLOOR
620 NEWPORT CENTER DRIVE
NEWPORT BEACH, CA 92660

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