Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/11/1997
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Application #:
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08410818
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Filing Dt:
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03/27/1995
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Inventor:
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KOJI TAKAHASHI
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Title:
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FAILURE ANALYZER FOR SEMICONDUCTOR TESTER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SHINJUKU-KU |
NS BLDG., 4-1, NISHI-SHINJUKU 2-CHOME |
TOKYO, JAPAN |
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WILLIAM B. BUNKER |
KNOBBE, MARTENS, OLSON & BEAR |
16TH FLOOR |
620 NEWPORT CENTER DRIVE |
NEWPORT BEACH, CA 92660 |
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