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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/18/1997
Application #:
08382751
Filing Dt:
01/31/1995
Inventor:
WITAWAT WIJARANAKULA
Title:
METHOD FOR MANUFACTURING A CALIBRATION WAFER HAVING A MICRODEFECT-FREE LAYER OF A PRECISELY PREDETERMINED DEPTH
Assignment: 1
Reel/Frame:
007348/0104Recorded: 01/31/1995Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/30/1995
Assignee:
4111 NE 112TH AVENUE
VANCOUVER, WASHINGTON 98682
Correspondent:
MICHAEL O. SCHEINBERG
STOEL RIVES BOLEY JONES & GREY
900 SW FIFTH AVENUE
SUITE 2300
PORTLAND, OREGON 97204-1268
Assignment: 2
Reel/Frame:
010603/0091Recorded: 08/05/1999Pages: 3
Conveyance:
CORRECTION OF PREVIOUSLY RECORDED ASSIGNMENT AT REEL 7348, FRAME 0106. TO CORRECT STATE OF INCORPORATION.
Assignor:
Exec Dt:
01/30/1995
Assignee:
4111 NE 112TH AVENUE
VANCOUVER, WASHINGTON 98682
Correspondent:
SEH AMERICA, INC.
TIMOTHY H. COURSON, ESQ.
4111 NE 112TH AVENUE
VANCOUVER, WA 98682

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