Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/10/1997
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Application #:
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08572300
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Filing Dt:
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12/13/1995
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Inventors:
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GI-WOON CHA, JEI-HWAN YOO
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Title:
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BURN-IN TEST CIRCUIT AND METHOD IN SEMICONDUCTOR MEMORY DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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416, MAETAN-DONG, PALDAL-GU, SUWON-CITY |
KYUNGKI-DO, KOREA, DEMOCRATIC PEOPLE'S REPUBLIC OF |
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CUSHMAN DARBY & CUSHMAN,LLP |
1100 NEW YORK AVENUE, N.W. |
NINTH FLOOR, EAST TOWER |
WASHINGTON, DC 20005-3918 |
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