Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
2
|
|
Patent #:
|
|
Issue Dt:
|
08/12/1997
|
Application #:
|
08528194
|
Filing Dt:
|
09/14/1995
|
|
Inventors:
|
KATSUMI MOGI, OSAMU ENDO
|
|
Title:
|
FILM THICKNESS MEASURING APPARATUS, FILM THICKNESS MEASURING METHOD AND WAFER POLISHING SYSTEM MEASURING A FILM THICKNESS IN CONJUNCTION WITH A LIQUID TANK
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-6-1, OHTEMACHI, CHIYODA-KU |
| TOKYO, JAPAN 100 |
|
|
|
|
| ARMSTRONG, WESTERMAN, HATTORI ET AL |
| PATRICK D. MUIR |
| SUITE 1000 |
| 1725 K STREET, N.W. |
| WASHINGTON, D.C. 20006 |
|
|
|
Assignment:
2
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 11-1, HANEDA ASAHI-CHO, OHTA-KU |
| TOKYO, JAPAN 144-8510 |
|
|
|
|
| ARMSTRONG, KRATZ, QUINTOS, HANSON & BROO |
| 1725 K STREET, NW |
| SUITE 1000 |
| WASHINGTON, DC 20006 |
|
|
Search Results as of:
04/28/2024 03:12 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
