Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/10/1998
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Application #:
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08701699
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Filing Dt:
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08/22/1996
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Inventor:
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TOSHIMI OHSAWA
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Title:
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FAIL ANALYSIS DEVICE FOR SEMICONDUCTOR MEMORY TEST SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NS BUILDING 4-1 NISHI-SHINJUKU, SHINJUKU-KU |
| TOKYO, JAPAN |
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| KNOBBE, MARTENS, OLSON & BEAR, LLP. |
| YASUO MURAMATSU |
| 620 NEWPORT CENTER DRIVE, 16TH FLOOR |
| NEWPORT BEACH, CA 92660 |
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