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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/31/1998
Application #:
08587167
Filing Dt:
01/16/1996
Inventor:
KENICHI FUJISAKI
Title:
SCAN TEST CIRCUIT FOR USE IN SEMICONDUCTOR INTEGRATED CIRCUIT
Assignment: 1
Reel/Frame:
007914/0614Recorded: 01/12/1996Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/21/1995
Assignee:
1303 EAST ALGONQUIN ROAD
SCHAUMBURG, ILLINOIS 60196
Correspondent:
MOTOROLA, INC.
HARRY A. WOLIN
INTELLECTUAL PROPERTY DEPT.- STE R3108
P.O.BOX 10219
SCOTTSDALE, AZ 85271-0219

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