Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/09/1998
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Application #:
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08752419
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Filing Dt:
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11/19/1996
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Inventors:
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HIDETO HIDAKA, MIKIO ASAKURA, KIYOHIRO FURUTANI, TETSUO KATO
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Title:
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SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CHECKING SAME FOR DEFECT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO 100, JAPAN |
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| LOWE, PRICE, LEBLANC & BECKER |
| GENE Z. RUBINSON |
| 99 CANAL CENTER PLAZA |
| SUITE 300 |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-24, TOYOSU 3-CHOME, KOUTOU-KU |
| TOKYO, JAPAN 135-0061 |
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| MATTINGLY & MALUR, PC |
| 1800 DIAGONAL ROAD |
| SUITE 210 |
| ALEXANDRIA, VA 22314 |
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