Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
08/04/1998
|
Application #:
|
08720065
|
Filing Dt:
|
09/27/1996
|
|
Inventors:
|
HISASHI MASUMURA, HIDEO KUDO, SHINGO SUMIE, HIDETOSHI TSUNAKI, YUJI HIRAO et al
|
|
Title:
|
METHOD OF AND APPARATUS FOR DETERMINING RESIDUAL DAMAGE TO WAFER EDGES
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| TOGINBIRU 4-2, MARUNOUCHI 1-CHOME |
| CHIYODA-KU, TOKYO 100, JAPAN |
|
|
|
| 3018, WAKINOHAMA-CHO, 1-CHOME |
| CHUO-KU, KOBE-SHI, HYOGO 651, JAPAN |
|
|
|
|
| EVENSON, MCKEOWN, EDWARDS & LENAHAN |
| 1200 G ST., NW |
| SUITE 700 |
| WASHINGTON, DC 20005 |
|
|
Search Results as of:
04/30/2024 03:17 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
