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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/18/1998
Application #:
08700451
Filing Dt:
11/18/1996
Inventor:
YOSHIAKI KATO
Title:
HIGH SPEED TEST PATTERN TRANSFER APPARATUS FOR SEMICONDUCTOR TEST SYSTEM
Assignment: 1
Reel/Frame:
008227/0203Recorded: 11/18/1996Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/01/1996
Assignee:
2-CHOME, SHINJUKU-KU
NS BUILDING, 4-1 NISHI-SHINJUKU
TOKYO, JAPAN
Correspondent:
KNOBBE, MARTENS, OLSON & BEAR, LLP
YASUO MURAMATSU
SIXTEENTH FLOOR
620 NEWPORT CENTER DRIVE
NEWPORT BEACH, CA 92660

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