Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/01/1998
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Application #:
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08653212
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Filing Dt:
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05/28/1996
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Inventors:
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VALENTIN N. TODOROV, YOSHI TANASE, YAN YE, XUE-YU QIAN, ARTHUR H. SATO, PETER LOEWENHARDT et al
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Title:
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APPARATUS FOR MEASURING PLASMA CHARACTERISTICS WITHIN A SEMICONDUCTOR WAFER PROCESSING SYSTEM AND A METHOD OF FABRICATING AND USING SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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3050 BOWERS AVENUE |
PATENT COUNSEL |
SANTA CLARA, CALIFORNIA 95054 |
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APPLIED MATERIALS, INC. |
RAYMOND R. MOSER, JR. |
3050 BOWERS AVE. |
P.O. BOX 450-A |
SANTA CLARA, CA 95052 |
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