Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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11/03/1998
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Application #:
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08711935
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Filing Dt:
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09/11/1996
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Inventors:
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AKIO YAMADA, SATORU SAGOU, HITOSHI WATANABE, SATORU YAMAZAKI, KIICHI SAKAMOTO et al
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Title:
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METHOD OF DETECTING A DEFICIENCY IN A CHARGED-PARTICLE-BEAM EXPOSURE MASK
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211, JAPAN |
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| STAAS & HALSEY |
| H. J. STAAS |
| 700 ELEVENTH STREET, N.W. |
| SUITE 500 |
| WASHINGTON, D.C. 20001 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO 163-0722, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: H. J. STAAS |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 2-10-23 SHIN-YOKOHAMA |
| KOHOKU-KU, YOKOHAMA-SHI |
| KANAGAWA 222-0033, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: PAUL I. KRAVETZ |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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Assignment:
4
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| 2-100-45 SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
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| WESTERMAN, HATTORI, DANIELS AND ADRIAN |
| 1250 CONNECTICUT AVENUE, NW |
| SUITE 700 |
| WASHINGTON, DC 20036 |
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