Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/17/1998
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Application #:
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08732068
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Filing Dt:
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10/16/1996
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Inventors:
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ARUNAVA MAJUMDAR, JIE LAI, KE LUO
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Title:
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USE OF FOCUSED ION AND ELECTRON BEAMS FOR FABRICATING A SENSOR ON A PROBE TIP USED FOR SCANNING MULTIPROBE MICROSCOPY AND THE LIKE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 300 LAKESIDE DRIVE 22ND FLOOR |
| OAKLAND, CALIFORNIA 94612 |
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| DANIEL L. DAWES |
| 5252 KENILWORTH DRIVE |
| HUNTINGTON BEACH, CA 92649 |
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Assignment:
2
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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| OFFICE OF THE GENERAL COUNSEL, SUITE 1265 |
| 4201 WILSON BOULEVARD |
| ARLINGTON, VIRGINIA 22230 |
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| ROBIN CLAY FRITSCH |
| OFFICE OF THE GENERAL COUNSEL |
| 4201 WILSON BOULEVARD, |
| SUITE 1265 |
| ARLINGTON, VA 22230 |
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