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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
11/17/1998
Application #:
08732068
Filing Dt:
10/16/1996
Inventors:
ARUNAVA MAJUMDAR, JIE LAI, KE LUO
Title:
USE OF FOCUSED ION AND ELECTRON BEAMS FOR FABRICATING A SENSOR ON A PROBE TIP USED FOR SCANNING MULTIPROBE MICROSCOPY AND THE LIKE
Assignment: 1
Reel/Frame:
008276/0511Recorded: 10/16/1996Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/05/1996
Exec Dt:
09/30/1996
Exec Dt:
09/30/1996
Assignee:
300 LAKESIDE DRIVE 22ND FLOOR
OAKLAND, CALIFORNIA 94612
Correspondent:
DANIEL L. DAWES
5252 KENILWORTH DRIVE
HUNTINGTON BEACH, CA 92649
Assignment: 2
Reel/Frame:
013075/0784Recorded: 07/12/2002Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/26/2002
Assignee:
OFFICE OF THE GENERAL COUNSEL, SUITE 1265
4201 WILSON BOULEVARD
ARLINGTON, VIRGINIA 22230
Correspondent:
ROBIN CLAY FRITSCH
OFFICE OF THE GENERAL COUNSEL
4201 WILSON BOULEVARD,
SUITE 1265
ARLINGTON, VA 22230

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