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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/01/1998
Application #:
08645498
Filing Dt:
05/16/1996
Inventors:
SI-HYOUNG LEE, SEUNG-HWAN PARK, KYOUNG-HO YANG, GUN-WON LEE
Title:
PROBE CONTROL METHOD FOR LEVELING PROBE PINS FOR A PROBE TEST SEQUENCE
Assignment: 1
Reel/Frame:
008129/0008Recorded: 08/22/1996Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/26/1996
Exec Dt:
06/26/1996
Exec Dt:
06/26/1996
Exec Dt:
06/26/1996
Assignee:
416, MAETAN-DONG, PALDAL-GU, SUWON-CITY
KYUNGKI-DO, KOREA, REPUBLIC OF
Correspondent:
LAGERMAN & JONES, P.C.
RAYMOND C. JONES, ESQ.
11921 FREEDOM DRIVE, SUITE 550
RESTON, VA 22090
Assignment: 2
Reel/Frame:
028984/0774Recorded: 09/14/2012Pages: 55
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/04/2012
Assignee:
95, SAMSUNG 2 RO, GIHEUNG-GU
YONGIN-CITY, GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
JAMES J. MERRICK
CANTOR COLBURN LLP
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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