Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/08/1998
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Application #:
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08852990
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Filing Dt:
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05/08/1997
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Inventors:
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JAMES P. FULTON, MIN NAMKUNG, JAMES P. FULTON, MIN NAMKUNG, JOHN W. SIMSON et al
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Title:
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THICKNESS GAUGING OF SINGLE-LAYER CONDUCTIVE MATERIALS WITH TWO-POINT NOW LINEAR CALIBRATION ALGORITHM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 107 RESEARCH DRIVE |
| HAMPTON, VIRGINIA 23666 |
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| NASA LANGLEY RESEARCH CENTER |
| ROBIN W. EDWARDS |
| 3 LANGLEY BOULEVARD MAIL STOP 212 |
| HAMPTON, VA 23681-0001 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| WASHINGTON, DISTRICT OF COLUMBIA 20546 |
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| ROBIN W. EDWARDS |
| NASA LANGLEY RESEARCH CENTER |
| MAIL STOP 212 |
| 3 LANGLEY BOULEVARD |
| HAMPTON, VIRGINIA 23681-0001 |
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