Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/22/1999
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Application #:
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08765048
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Filing Dt:
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05/09/1997
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Inventors:
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TAKASHI SAITO, HIROMI OSHIMA
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Title:
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MEMORY FAIL ANALYSIS DEVICE IN SEMICONDUCTOR MEMORY TEST SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NS BUILDING 4-1 NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO 163, JAPAN |
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| KNOBBE, MARTENS, OLSON & BEAR, LLP |
| YASUO MURAMATSU |
| SIXTEENTH FLOOR |
| 620 NEWPORT CENTER DRIVE |
| NEWPORT BEACH, CA 92660 |
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