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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
07/06/1999
Application #:
08932894
Filing Dt:
09/18/1997
Inventors:
YASUHIRO SHIMADA, KEISAKU NAKAO, ATSUO INOUE, MASAMICHI AZUMA, EIJI FUJII
Title:
METHOD FOR ACCELERATED TEST OF SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
008722/0703Recorded: 09/18/1997Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/08/1997
Exec Dt:
09/08/1997
Exec Dt:
09/08/1997
Exec Dt:
09/08/1997
Exec Dt:
09/08/1997
Assignee:
1-1, SAIWAI-CHO, TAKATSUKI-SHI
OSAKA 569-11, JAPAN
Correspondent:
MERCHANT, GOULD, SMITH, EDELL, ET AL.
DOUGLAS P. MUELLER
3100 NORWEST CENTER
90 SOUTH SEVENTH STREET
MINNEAPOLIS, MN 55402-4131
Assignment: 2
Reel/Frame:
012495/0898Recorded: 01/29/2002Pages: 15
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/04/2001
Assignee:
NO. 1006 KADOMA
KADOMA CITY, OSAKA, JAPAN
Correspondent:
SUGHRUE MION, PLLC
DAVID J. CUSHING
2100 PENNSYLVANIA AVENUE, N.W.
SUITE 800
WASHINGTON, D.C. 20037-3213

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