Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/24/1999
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Application #:
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08877502
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Filing Dt:
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06/17/1997
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Inventors:
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ICHIROU YAMAGUCHI, TAKASHI FUKANO
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Title:
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METHOD OF MEASURING THICKNESS AND REFRACTIVE INDICES OF COMPONENT LAYERS OF LAMINATED STRUCTURE AND MEASURING APPARTUS FOR CARRYING OUT THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2-1, HIROSAWA, WAKO-SHI, SAITAMA-KEN |
WAKO-SHI, JAPAN |
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JACOBSON, PRICE, HOLMAN & STERN |
JOHN C. HOLMAN |
400 7TH STREET, N.W. |
WASHINGTON, DC 20004 |
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