Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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08/24/1999
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Application #:
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08725950
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Filing Dt:
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10/07/1996
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Inventors:
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SHINGO SUMIE, TSUTOMU MORIMOTO, YUICHIRO GOTOH, EIJI TAKAHASHI, SHOUJI KANBE et al
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Title:
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METHOD AND APPARATUS FOR CLASSIFYING A DEFECT ON A SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-18, WAKINOHAMACHO 1-CHOME, CHUO-KU |
| KOBE-SHI, HYOGO-KEN 651, JAPAN |
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| KITA-AOYAMA 3-CHOME, MINATO-KU |
| AOYAMA FUJI BLDG., 6-12, |
| TOKYO 107, JAPAN |
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| KITA-AOYAMA 3-CHOME, MINATO-KU |
| 302-2, HIRANOCHO, NISHIWAKI-SHI |
| HYOGO-KEN 677, JAPAN |
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| HAZEL & THOMAS |
| STANLEY P. FISHER |
| 3110 FAIRVIEW PARK DRIVE, SUITE 1400 |
| FALLS CHURCH, VIRGINIA 22042 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 302-2, HIRANOCHO, NISHIWAKI-SHI |
| HYOGO-KEN 677, JAPAN |
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| HAZEL & THOMAS |
| STANLEY P. FISHER |
| 3110 FAIRVIEW PARK DRIVE |
| SUITE 1400 |
| FALLS CHURCH, VIRGINIA 22042 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8000 SOUTH FEDERAL WAY |
| P.O. BOX 6, M/S 1-525 |
| BOISE, IDAHO 83707-0006 |
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| MARK S. MATKIN |
| WELLS ST. JOHN P.S. |
| 601 WEST FIRST AVENUE |
| SUITE 1300 |
| SPOKANE, WA 99201-3828 |
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