Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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08/31/1999
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Application #:
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08893706
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Filing Dt:
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07/11/1997
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Inventors:
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ZAHI DOITEL, ARIE HARNIK, ZIV ATZMON
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Title:
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APPARATUS FOR MEASURING THE PROCESSING TEMPERATURE OF WORKPIECES PARTICULARLY SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O.B. 171 |
| MIGAL, HAEMEK, ISRAEL 10551 |
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| LOWE PRICE LEBLANC & BECKER |
| GENE Z. RUBINSON |
| 99 CANAL CENTER PLAZA, SUITE 300 |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 171 |
| MIGAL, HAEMEK, IRAN, ISLAMIC REPUBLIC OF 10551 |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| RAMAT GABRIEL INDUSTRIAL PARK,PO BOX 171 |
| RAFI KORIAT |
| MIGDAL HA'EMEK, ISRAEL 10551 |
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| CONNOLLY BOVE ET AL |
| PATRICIA SMINK ROGOWSKI |
| 1220 MARKET STREET |
| PO BOX 2207 |
| WILMINGTON, DE 19899 |
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