Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/19/1999
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Application #:
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09080451
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Filing Dt:
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05/18/1998
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Inventors:
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NORIYUKI MASUDA, SHINICHI HASHIMOTO
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Title:
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TEST PATTERN GENERATOR CIRCUIT FOR IC TESTING EQUIPMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHICHO 1-CHOME |
| NERIMA-KU, TOKYO 179-0071, JAPAN |
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| GALLAGHER & LATHROP |
| DAVID N. LATHROP, ESQUIRE |
| 601 CALIFORNIA STREET |
| SUITE 1111 |
| SAN FRANCISCO, CALIFORNIA 94108-2805 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NERIMA-KU |
| 32-1, ASAHICHO 1-CHOME |
| TOKYO 179-0071, JAPAN |
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| GALLAGHER & LATHROP |
| DAVID N. LATHROP, ESQUIRE |
| A PROFESSIONAL CORPORATION |
| 601 CALIFORNIA STREET, SUITE 1111 |
| SAN FRANCISCO, CA 94108-2805 |
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