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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/26/1999
Application #:
08966200
Filing Dt:
11/07/1997
Inventor:
JAE JIN LEE
Title:
STRESS TEST APPARATUS AND METHOD FOR SEMICONDUCTOR MEMORY DEVICE
Assignment: 1
Reel/Frame:
008816/0492Recorded: 11/07/1997Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/15/1997
Assignee:
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI
KYOUNGKI-DO, KOREA, REPUBLIC OF
Correspondent:
NATH & ASSOCIATES
GARY M. NATH
1835 K STREET, N.W. -- SUITE 750
WASHINGTON, DC 20006-1203

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