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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
11/02/1999
Application #:
08887865
Filing Dt:
07/03/1997
Inventors:
JON OPSAL, LI CHEN
Title:
APPARATUS FOR EVALUATING METALIZED LAYERS ON SEMICONDUCTORS
Assignment: 1
Reel/Frame:
008866/0881Recorded: 12/22/1997Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/24/1997
Assignee:
1250 RELIANCE WAY
FREMONT, CALIFORNIA 94539
Correspondent:
LIMBACH & LIMBACH L.L.P.
MICHAEL A. STALLMAN
2001 FERRY BUILDING
SAN FRANCISCO, CA 94111
Assignment: 2
Reel/Frame:
009020/0443Recorded: 03/02/1998Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/24/1997
Exec Dt:
11/24/1997
Assignee:
1250 RELIANCE WAY
FREMONT, CALIFORNIA 94539
Correspondent:
LIMBACH & LIMBACH L.L.P.
MICHAEL A. STALLMAN
2001 FERRY BLDG.
SAN FRANCISCO, CA 94111
Assignment: 3
Reel/Frame:
014446/0150Recorded: 07/30/2003Pages: 12
Conveyance:
SECURITY AGREEMENT
Assignor:
Exec Dt:
06/13/2003
Assignee:
3003 TASMAN DR.
SANTA CLARA, CALIFORNIA 95054
Correspondent:
BUCHALTER, NEMER & FIELD & YOUNGER
MRS. KIM WALKER
601 SOUTH FIGUEROA ST., STE. 2400
LOS ANGELES, CA 90017

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