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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/30/1999
Application #:
08842345
Filing Dt:
04/24/1997
Inventors:
STEPHEN J. FONASH, OSAMA O. AWADELKARIM, MURAT OKANDAN, MARIA M. OZAITA-MINTEGUI
Title:
METHOD AND APPARATUS TESTING IC CHIPS FOR DAMAGE DURING FABRICATION
Assignment: 1
Reel/Frame:
008814/0566Recorded: 11/03/1997Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/27/1997
Exec Dt:
10/22/1997
Assignee:
304 OLD MAIN
UNIVERSITY PARK, PENNSYLVANIA 16802
Correspondent:
THE PENNSYLVANIA STATE UNIVERSITY
THOMAS J. MONAHAN
113 TECHNOLOGY CENTER
UNIVERSITY PARK, PA 16802

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