Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08684149
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Filing Dt:
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07/19/1996
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Inventors:
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JUNICHIRO HIGASHI, ROBERT K. GRAUPNER
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Title:
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METHOD OF AND APPARATUS FOR MEASURING FLATNESS OF SEMICONDUCTOR WAFERS THAT HAVE NOT BEEN SUBJECTED TO DONOR-KILLER TREATMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2612, SHINOMIYA, HIRATSUKA-SHI |
| KANAGAWA 254, JAPAN |
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| WELSH & KATZ, LTD. |
| GERALD T. SHEKLETON, ESQ. |
| 120 SOUTH RIVERSIDE PLAZA, 22ND FLOOR |
| CHICAGO, IL 60603-3913 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 1324-2, MASURAGAHARA-MACHI |
| OMURA-SHI |
| NAGASAKI, JAPAN |
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| GERALD T. SHEKLETON |
| 120 S. RIVERSIDE PLAZA, 22ND FLOOR |
| CHICAGO, IL 60606 |
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Assignment:
3
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CORRECTIVE ASSIGNMENT TO CORRECT THE CITY OF RECEIVING PARTY PREVIOUSLY RECORDED ON REEL 019084 FRAME 0854. ASSIGNOR(S) HEREBY CONFIRMS THE CITY SHOULD BE CORRECTED TO KANAGAWA.
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| 1324-2, MASURAGAHARA-MACHI |
| OMURA-SHI |
| KANAGAWA, JAPAN |
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| GERALD T. SHEKLETON |
| 120 S. RIVERSIDE PLAZA, 22ND FLOOR |
| CHICAGO, IL 60606 |
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Assignment:
4
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CORRECTIVE ASSIGNMENT TO CORRECT THE COMPLETE ADDRESS OF RECEIVING PARTY, PREVIOUSLY RECORDED ON REEL 019140 FRAME 0970. (ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT ADDRESS OF APPLICANT IS 26-1 SHINOMIYA 3-CHOME, HIRATSUKA-SHI, KANAGAWA, JAPAN.)
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| 25-1, SHINOMIYA 3-CHOME |
| HIRATSUKA-SHI |
| KANAGAWA, JAPAN |
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| GERALD T. SHEKLETON |
| 120 S. RIVERSIDE PLAZA, 22ND FLOOR |
| CHICAGO, ILLINOIS 60606 |
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