Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/04/2000
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Application #:
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08987736
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Filing Dt:
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12/09/1997
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Inventors:
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PAUL J. STEFFAN, BRYAN TRACY, MING CHUN CHEN
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Title:
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SEMICONDUCTOR WAFER OPTICAL SCANNING SYSTEM AND METHOD USING SWATH-AREA DEFECT LIMITATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE, M/S 68 |
| SUNNYVALE, CALIFORNIA 94088 |
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| LARIVIERE GRUBMAN & PAYNE |
| VICTOR FLORES |
| 4 JUSTIN COURT, SUITE A |
| P.O. BOX 3140 |
| MONTEREY, CA 93942 |
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